VST 2020: Message from the Chairs

Autoren Martin Pinzger
Rudolf Ramler
Editoren
Titel VST 2020: Message from the Chairs
Buchtitel Proceedings of the 2020 IEEE 3rd International Workshop on Validation, Analysis, and Evolution of Software Tests (VST'20)
Typ Editorial
ISBN 978-1-7281-6271-3
Monat February
Jahr 2020
SCCH ID# 20014
Abstract

Welcome to the 3rd Workshop on Validation, Analysis and Evolution of Soft-ware Tests (VST 2020). The workshop takes place in London, Ontario, Canada, on February 18, 2020, co-located with SANER 2020, the 27th IEEE International Confer-ence on Software Analysis, Evolution and Reengineering.
Software projects accumulate large sets of test cases that encode expert knowledge about the software under test to the extent of many person years. Projects rely on these tests as a backbone for evolving the software system and for assuring quality. Over time, however, the reliability of the tests decreases and they become difficult to understand and maintain. Extra effort is required for analyzing test results, for repairing broken tests, and for adapting test suites to the evolving software systems.
The aim of the Workshop on Validation, Analysis and Evolution of Software Tests is to advance the state of the art in development and maintenance of software tests. The workshop provides an open und inclusive forum for exchanging experiences, presenting solutions, and discussing new ideas from software analysis, evolution and reengineering applied to test development and maintenance.
VST 2020 received eleven submissions, from which six papers were selected for pub-lication and presentation at the workshop. The selected papers cover a diverse set of topics including empirical research on unit testing, tool support for expanding test cases with additional asserts, and the analysis and improvement of fault localiza-tion. Each paper was reviewed by three members of the program committee. In ad-dition, the workshop features a keynote by Serge Demeyer (University of Antwerp) on "Next level test automation".
We would like to thank the authors of submitted papers, the members of the pro-gram committee, and all participants for their valuable input and contributions to the success of the workshop.