Proceedings of the 2nd Workshop on Validation, Analysis and Evolution of Software Tests (VST 2018)

Authors
Editors Cyrille Artho
Rudolf Ramler
Title Proceedings of the 2nd Workshop on Validation, Analysis and Evolution of Software Tests (VST 2018)
Type proceedings
Publisher IEEE
ISBN 978-1-5386-6492-6
Month March
Year 2018
SCCH ID# 18028
Abstract

Welcome to the 2018 IEEE Workshop on Validation, Analysis and Evolution of Software Tests (VST 2018). This workshop takes place in Campobasso, Italy, on March 20, 2018. Like the previous installment, it is co-located with the IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER). The main focus of the workshop is to advance the state of the art in test development and maintenance.

Software projects accumulate large sets of test cases, encoding valuable expert knowledge about the software under test to the extent of many person years. Over time the reliability of the tests decreases, and they become difficult to understand and maintain. Extra effort is required for repairing broken tests and for adapting testsuites and models to evolving software systems.

VST is an unique event bringing together academics, industrial researchers, and practitioners for exchanging experiences, solutions and new ideas in applying methods, techniques and tools from software analysis, evolution and reengineering to advance the state of the art in test development and maintenance.

We would like to thank the conference chairs, in particular the general chair, Rocco Oliveto, the workshop chair, Takashi Kobayashi, and the proceedings chair, Fausto Fasano, for organizing this event for us. We would also like to thank the conference publishing service for handling the proceedings. Finally, we would like to thank the authors for their efforts and contributions, and the program committee for their timely, high-quality reviews.

This edition of VST received seven high-quality submissions, from which we selected four papers for publication and presentation at the workshop. Each paper was reviewed by three expert reviewers. In addition to the accepted papers, we have a keynote by Sebastiano Panichella, University of Zurich, which is accompanied by an invited paper.